2010 11th international symposium on quality electronic design : (ISQED 2010) : San Jose, California, USA : 22-24 March 2010 : ISQED 2010 conference : ISQED exhibition : Mar 2010, San Jose, CA.

• 資料種別: 図書
• ISBN: 9781424464548
• ISSN: 19483287
• タイトル: 2010 11th international symposium on quality electronic design : (ISQED 2010) : San Jose, California, USA : 22-24 March 2010 : ISQED 2010 conference : ISQED exhibition : Mar 2010, San Jose, CA.
• 著者標目: International Symposium on Quality Electronic Design (11th : 2010 : San Jose, Calif.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2010.
• 出版年（W3CDTF）: 2010
• 数量: xix, 892 p.
• 形態の詳細: ill.
• 大きさ: 27 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits--Very large scale integration--Reliability--Congresses.; Integrated circuits--Very large scale integration--Design and construction--Congresses.; Integrated circuits--Very large scale integration--Computer-aided design--Congresses.; Integrated circuits--Very large scale integration--Testing--Quality control--Congresses.
• LCC: TK7874.75
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Papers.; "This one day tutorial consists of (...) Additionally three embedded tutorials by experts are provided (...)" -- welcome to ISQED 2010.; "ISQED exhibition held in conjunction with technical sessions on Tuesday, (...)" -- welcome to ISQED 2010.; IEEE cat no CFP10250-PRT.
• 書誌注記: Includes bibliographical references.
• 一次資料へのリンクURL: IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=5443864
• 所蔵機関: 国立国会図書館
• 請求記号: M17-12-334
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011255003; http://id.ndl.go.jp/bib/000011255003
• OCLC番号: 662504174; https://www.worldcat.org/oclc/662504174
• 目録規則: 英米目録規則
• 整理区分コード: 215