2010 11th international symposium on quality electronic design : (ISQED 2010) : San Jose, California, USA : 22-24 March 2010 : ISQED 2010 conference : ISQED exhibition : Mar 2010, San Jose, CA.

• Material Type: 図書
• ISBN: 9781424464548
• ISSN: 19483287
• Title: 2010 11th international symposium on quality electronic design : (ISQED 2010) : San Jose, California, USA : 22-24 March 2010 : ISQED 2010 conference : ISQED exhibition : Mar 2010, San Jose, CA.
• Author Heading: International Symposium on Quality Electronic Design (11th : 2010 : San Jose, Calif.)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2010.
• Publication Date (W3CDTF): 2010
• Extent: xix, 892 p.
• Other physical details: ill.
• Size: 27 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits--Very large scale integration--Reliability--Congresses.; Integrated circuits--Very large scale integration--Design and construction--Congresses.; Integrated circuits--Very large scale integration--Computer-aided design--Congresses.; Integrated circuits--Very large scale integration--Testing--Quality control--Congresses.
• LCC: TK7874.75
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; "This one day tutorial consists of (...) Additionally three embedded tutorials by experts are provided (...)" -- welcome to ISQED 2010.; "ISQED exhibition held in conjunction with technical sessions on Tuesday, (...)" -- welcome to ISQED 2010.; IEEE cat no CFP10250-PRT.
• Note (Bibliography): Includes bibliographical references.
• Source: IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=5443864
• Holding library: 国立国会図書館
• Call No.: M17-12-334
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000011255003; http://id.ndl.go.jp/bib/000011255003
• OCLC No.: 662504174; https://www.worldcat.org/oclc/662504174
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 215