2010 28th VLSI test symposium : (VTS 2010) : Santa Cruz, California, USA : 19-22 April 2010 : 2010 28th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meetings : TTTC test technology educational program (TTEP) 2010 : VTS conference : Apr 2010, Santa Cruz, CA.

• 資料種別: 図書
• ISBN: 9781424466498
• ISSN: 10930167
• タイトル: 2010 28th VLSI test symposium : (VTS 2010) : Santa Cruz, California, USA : 19-22 April 2010 : 2010 28th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meetings : TTTC test technology educational program (TTEP) 2010 : VTS conference : Apr 2010, Santa Cruz, CA.
• 著者標目: IEEE VLSI Test Symposium (28th : 2010 : Santa Cruz, Calif.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2010.
• 出版年（W3CDTF）: 2010
• 数量: xxvii, 358 p.
• 形態の詳細: ill.
• 大きさ: 27 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits--Very large scale integration--Testing--Congresses.
• LCC: TK7874
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Papers and abstracts.; "Welcome to VTS 2010, the twenty-eighth in a series of annual symposia (...)" -- foreword.; "This year the Workshop on Test of Wireless Circuits and Systems will take place in conjunction with VTS for the third year." -- foreword.; "Two tutorials are offered by (...)" -- foreword.; IEEE cat no CFP10029-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 一次資料へのリンクURL: IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=5464131
• 所蔵機関: 国立国会図書館
• 請求記号: M17-12-839
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011274305; http://id.ndl.go.jp/bib/000011274305
• OCLC番号: 678797423; https://www.worldcat.org/oclc/678797423
• 目録規則: 英米目録規則
• 整理区分コード: 215