2010 28th VLSI test symposium : (VTS 2010) : Santa Cruz, California, USA : 19-22 April 2010 : 2010 28th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meetings : TTTC test technology educational program (TTEP) 2010 : VTS conference : Apr 2010, Santa Cruz, CA.

2010 28th VLSI test symposium : (VTS 2010) : Santa Cruz, California, USA : 19-22 April 2010 : 2010 28th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meetings : TTTC test technology educational program (TTEP) 2010 : VTS conference : Apr 2010, Santa Cruz, CA.

Call No. (NDL): M17-12-839
Bibliographic ID of National Diet Library: 000011274305

Material type: 図書

Author: IEEE VLSI Test Symposium (28th : 2010 : Santa Cruz, Calif.)

Publisher: IEEE

Publication date: c2010.

Material Format: Paper

Capacity, size, etc.: xxvii, 358 p. ; 27 cm.

NDC: -

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Notes on use

Note (General)：: Papers and abstracts."Welcome to VTS 2010, the twenty-eighth in a series of annual symposia (...)" -- foreword."This year the Workshop on Test of Wire...

Other physical details：: ill.

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Paper

Material Type: 図書
ISBN: 9781424466498
ISSN: 10930167
Title: 2010 28th VLSI test symposium : (VTS 2010) : Santa Cruz, California, USA : 19-22 April 2010 : 2010 28th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meetings : TTTC test technology educational program (TTEP) 2010 : VTS conference : Apr 2010, Santa Cruz, CA.
Author Heading: IEEE VLSI Test Symposium (28th : 2010 : Santa Cruz, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2010.
Publication Date (W3CDTF): 2010
Extent: xxvii, 358 p.
Other physical details: ill.
Size: 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits--Very large scale integration--Testing--Congresses.
LCC: TK7874
NDLC: M17
Target Audience: 一般
Note (General): Papers and abstracts.
"Welcome to VTS 2010, the twenty-eighth in a series of annual symposia (...)" -- foreword.
"This year the Workshop on Test of Wireless Circuits and Systems will take place in conjunction with VTS for the third year." -- foreword.
"Two tutorials are offered by (...)" -- foreword.
IEEE cat no CFP10029-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Source: IEEE Xplore
http://ieeexplore.ieee.org/servlet/opac?punumber=5464131
Holding library: 国立国会図書館
Call No.: M17-12-839
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011274305
http://id.ndl.go.jp/bib/000011274305
OCLC No.: 678797423
https://www.worldcat.org/oclc/678797423
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215