Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26-28 April 2011 : Orlando, Florida, United States : particle beam interaction workshop : SCANNING 2011 meeting : SPIE defense, security, and sensing 2011 (DSS 2011) conference : spring conferences on scanning microscopy : scanning microscopy in forensic science short course : annual SCANNING meetings : Apr 2011, Orlando, FL. (SPIE Proceedings ; 8036)

Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26-28 April 2011 : Orlando, Florida, United States : particle beam interaction workshop : SCANNING 2011 meeting : SPIE defense, security, and sensing 2011 (DSS 2011) conference : spring conferences on scanning microscopy : scanning microscopy in forensic science short course : annual SCANNING meetings : Apr 2011, Orlando, FL.

(SPIE Proceedings ; 8036)

国立国会図書館請求記号: M17-12-1033
国立国会図書館書誌ID: 000011287854

資料種別: 図書

著者: Postek, Michael T.

出版者: SPIE

出版年: c2011.

資料形態: 紙

ページ数・大きさ等: 1 v. (various pagings) ; 28 cm.

NDC: -

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資料に関する注記

一般注記：: Papers."This year, the SCANNING 2011 meeting joined the SPIE Defense, Security, and Sensing 2011 (DSS 2011) conference in Orlando, Florida." -- introd...

形態の詳細：: ill.

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紙

資料種別: 図書
ISBN: 9780819486103
ISSN（シリーズ）: 0277786X
タイトル: Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26-28 April 2011 : Orlando, Florida, United States : particle beam interaction workshop : SCANNING 2011 meeting : SPIE defense, security, and sensing 2011 (DSS 2011) conference : spring conferences on scanning microscopy : scanning microscopy in forensic science short course : annual SCANNING meetings : Apr 2011, Orlando, FL.
シリーズタイトル: SPIE Proceedings ; 8036
タイトル標目: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 8036. 0277-786X
著者標目: Postek, Michael T.
出版事項: Bellingham : SPIE
出版年月日等: c2011.
出版年（W3CDTF）: 2011
数量: 1 v. (various pagings)
形態の詳細: ill.
大きさ: 28 cm.
その他のタイトル: SPIE defense, security + sensing.
出版地（国名コード）: US
本文の言語コード: eng
件名標目: Scanning electron microscopes--Congresses.
LCC: QC371
NDLC: M17
対象利用者: 一般
一般注記: Papers.
"This year, the SCANNING 2011 meeting joined the SPIE Defense, Security, and Sensing 2011 (DSS 2011) conference in Orlando, Florida." -- introd.
書誌注記: Includes bibliographical references and author index.
所蔵機関: 国立国会図書館
請求記号: M17-12-1033
連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
書誌ID（NDLBibID）: 000011287854
http://id.ndl.go.jp/bib/000011287854
OCLC番号: 746464542
https://www.worldcat.org/oclc/746464542
目録規則: 英米目録規則
整理区分コード: 215