Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26-28 April 2011 : Orlando, Florida, United States : particle beam interaction workshop : SCANNING 2011 meeting : SPIE defense, security, and sensing 2011 (DSS 2011) conference : spring conferences on scanning microscopy : scanning microscopy in forensic science short course : annual SCANNING meetings : Apr 2011, Orlando, FL. (SPIE Proceedings ; 8036)

Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26-28 April 2011 : Orlando, Florida, United States : particle beam interaction workshop : SCANNING 2011 meeting : SPIE defense, security, and sensing 2011 (DSS 2011) conference : spring conferences on scanning microscopy : scanning microscopy in forensic science short course : annual SCANNING meetings : Apr 2011, Orlando, FL.

(SPIE Proceedings ; 8036)

Call No. (NDL): M17-12-1033
Bibliographic ID of National Diet Library: 000011287854

Material type: 図書

Author: Postek, Michael T.

Publisher: SPIE

Publication date: c2011.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers."This year, the SCANNING 2011 meeting joined the SPIE Defense, Security, and Sensing 2011 (DSS 2011) conference in Orlando, Florida." -- introd...

Other physical details：: ill.

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Paper

Material Type: 図書
ISBN: 9780819486103
ISSN (series): 0277786X
Title: Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26-28 April 2011 : Orlando, Florida, United States : particle beam interaction workshop : SCANNING 2011 meeting : SPIE defense, security, and sensing 2011 (DSS 2011) conference : spring conferences on scanning microscopy : scanning microscopy in forensic science short course : annual SCANNING meetings : Apr 2011, Orlando, FL.
Series Title: SPIE Proceedings ; 8036
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 8036. 0277-786X
Author Heading: Postek, Michael T.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2011.
Publication Date (W3CDTF): 2011
Extent: 1 v. (various pagings)
Other physical details: ill.
Size: 28 cm.
Additional Title: SPIE defense, security + sensing.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Scanning electron microscopes--Congresses.
LCC: QC371
NDLC: M17
Target Audience: 一般
Note (General): Papers.
"This year, the SCANNING 2011 meeting joined the SPIE Defense, Security, and Sensing 2011 (DSS 2011) conference in Orlando, Florida." -- introd.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-12-1033
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011287854
http://id.ndl.go.jp/bib/000011287854
OCLC No.: 746464542
https://www.worldcat.org/oclc/746464542
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215