Defects-recognition, imaging and physics in semiconductors 14 : selected, peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan : DRIP-14 : DRIP : Sep 2011, Miyazaki, Japan.
(Materials Science Forum ; 725)
国立国会図書館請求記号
M17-13-285
国立国会図書館書誌ID
023893005
資料種別
図書
著者
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)ほか