Defects-recognition, imaging and physics in semiconductors 14 : selected, peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan : DRIP-14 : DRIP : Sep 2011, Miyazaki, Japan. (Materials Science Forum ; 725)

Defects-recognition, imaging and physics in semiconductors 14 : selected, peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan : DRIP-14 : DRIP : Sep 2011, Miyazaki, Japan.

(Materials Science Forum ; 725)

Call No. (NDL): M17-13-285
Bibliographic ID of National Diet Library: 023893005

Material type: 図書

Author: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)ほか

Publisher: Trans Tech Publications

Publication date: c2012.

Material Format: Paper

Capacity, size, etc.: xiii, 299 p. ; 25 cm.

NDC: -

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Notes on use

Note (General)：: Selected papers.

Other physical details：: ill.

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Paper

Material Type: 図書
ISSN (series): 02555476
Title: Defects-recognition, imaging and physics in semiconductors 14 : selected, peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan : DRIP-14 : DRIP : Sep 2011, Miyazaki, Japan.
Series Title: Materials Science Forum ; 725
Title Heading: Materials science forum ; v. 725.
Author Heading: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
Yamada-Kaneta, Hiroshi.
Sakai, Akira (Professor of Engineering Science)
Publication, Distribution, etc.: Durnten-Zurich : Trans Tech Publications
Publication Date: c2012.
Publication Date (W3CDTF): 2012
Extent: xiii, 299 p.
Other physical details: ill.
Size: 25 cm.
Place of Publication (Country Code): CH
Text Language Code: eng
Subject Heading: Semiconductors--Defects--Congresses.
Image processing--Congresses.
Defects recognition
Imaging
Semicoductors
DRIP
NDLC: M17
Target Audience: 一般
Note (General): Selected papers.
Note (Bibliography): Includes bibliographical references and indexes.
Holding library: 国立国会図書館
Call No.: M17-13-285
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 023893005
http://id.ndl.go.jp/bib/023893005
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215