Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April-1 May 2013 : Baltimore, Maryland, United States : particle beam interaction modeling workshop : scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8729) : DSS conferences : microscopy for STEM educators workshop : Apr 2013, Baltimore, MD.

• 資料種別: 図書
• ISBN: 9780819495204 (paperback)
• ISSN（シリーズ）: 0277786X
• タイトル: Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April-1 May 2013 : Baltimore, Maryland, United States : particle beam interaction modeling workshop : scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8729) : DSS conferences : microscopy for STEM educators workshop : Apr 2013, Baltimore, MD.
• シリーズタイトル: SPIE Proceedings ; 8729
• 著者標目: Postek, Michael T.
• 出版事項: Bellingham : SPIE
• 出版年月日等: c2013.
• 出版年（W3CDTF）: 2013
• 数量: 1 v. (various pagings)
• 形態の詳細: ill.
• 大きさ: 28 cm.
• その他のタイトル: SPIE defense, security + sensing.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Scanning electron microscopes--Congresses.
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-14-673
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 024800928; http://id.ndl.go.jp/bib/024800928
• LC control number: 2013444260; https://lccn.loc.gov/2013444260
• 目録規則: 英米目録規則
• 整理区分コード: 215