Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April-1 May 2013 : Baltimore, Maryland, United States : particle beam interaction modeling workshop : scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8729) : DSS conferences : microscopy for STEM educators workshop : Apr 2013, Baltimore, MD. (SPIE Proceedings ; 8729)

Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April-1 May 2013 : Baltimore, Maryland, United States : particle beam interaction modeling workshop : scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8729) : DSS conferences : microscopy for STEM educators workshop : Apr 2013, Baltimore, MD.

(SPIE Proceedings ; 8729)

Call No. (NDL): M17-14-673
Bibliographic ID of National Diet Library: 024800928

Material type: 図書

Author: Postek, Michael T.

Publisher: SPIE

Publication date: c2013.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers.

Other physical details：: ill.

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Paper

Material Type: 図書
ISBN: 9780819495204 (paperback)
ISSN (series): 0277786X
Title: Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April-1 May 2013 : Baltimore, Maryland, United States : particle beam interaction modeling workshop : scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8729) : DSS conferences : microscopy for STEM educators workshop : Apr 2013, Baltimore, MD.
Series Title: SPIE Proceedings ; 8729
Author Heading: Postek, Michael T.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2013.
Publication Date (W3CDTF): 2013
Extent: 1 v. (various pagings)
Other physical details: ill.
Size: 28 cm.
Additional Title: SPIE defense, security + sensing.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Scanning electron microscopes--Congresses.
NDLC: M17
Target Audience: 一般
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-14-673
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024800928
http://id.ndl.go.jp/bib/024800928
LC Control Number: 2013444260
https://lccn.loc.gov/2013444260
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215