2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.

• 資料種別: 図書
• ISBN: 9781479999293
• タイトル: 2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.
• 著者標目: International Symposium on the Physical & Failure Analysis of Integrated Circuits (22nd : 2015 : Hsinchu, Taiwan); Institute of Electrical and Electronics Engineers.
• 出版事項: Piscataway, NJ : IEEE (出版)
• 出版年月日等: [2015]; 著作権日付 : ©2015
• 出版年（W3CDTF）: 2015
• 数量: xl, 580 pages
• 形態の詳細: illustrations
• 大きさ: 28 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• ジャンル・形式用語: Conference papers and proceedings.
• 表現種別: text
• 機器種別: unmediated
• キャリア種別: volume
• 件名標目: Integrated circuits--Reliability--Congresses.; Integrated circuits--Testing--Congresses.; Semiconductors--Failures--Congresses.; Integrated circuits--Defects--Congresses.; Integrated circuits--Defects.; Integrated circuits--Reliability.; Integrated circuits--Testing.; Semiconductors--Failures.
• LCC: TK7874
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Program, abstracts and papers.; Described as "The events of IPFA 2015 include a one-day tutorial, 3 days technical paper presentation, ... A one-day tutorial, scheduled for Monday, June 29, ..."--Page ii.; IEEE catalog number CFP15777-POD.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-17-1530
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 027675929; http://id.ndl.go.jp/bib/027675929
• 目録規則: RDA
• 整理区分コード: 215