2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.

2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.

Call No. (NDL): M17-17-1530
Bibliographic ID of National Diet Library: 027675929

Material type: 図書

Author: International Symposium on the Physical & Failure Analysis of Integrated Circuits (22nd : 2015 : Hsinchu, Taiwan)ほか

Publisher: IEEE

Publication date: [2015]

Material Format: Paper

Capacity, size, etc.: xl, 580 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Program, abstracts and papers.Described as "The events of IPFA 2015 include a one-day tutorial, 3 days technical paper presentation, ... A one-day tut...

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781479999293
Title: 2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.
Author Heading: International Symposium on the Physical & Failure Analysis of Integrated Circuits (22nd : 2015 : Hsinchu, Taiwan)
Institute of Electrical and Electronics Engineers.
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2015
Extent: xl, 580 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Integrated circuits--Reliability--Congresses.
Integrated circuits--Testing--Congresses.
Semiconductors--Failures--Congresses.
Integrated circuits--Defects--Congresses.
Integrated circuits--Defects.
Integrated circuits--Reliability.
Integrated circuits--Testing.
Semiconductors--Failures.
LCC: TK7874
NDLC: M17
Target Audience: 一般
Note (General): Program, abstracts and papers.
Described as "The events of IPFA 2015 include a one-day tutorial, 3 days technical paper presentation, ... A one-day tutorial, scheduled for Monday, June 29, ..."--Page ii.
IEEE catalog number CFP15777-POD.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-17-1530
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 027675929
http://id.ndl.go.jp/bib/027675929
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215