2016 IEEE AUTOTESTCON : Anaheim, California, USA : 12-15 September 2016 : systems readiness technology conference : conferences of the Institute of Electrical & Electronics Engineers : Sep 2016, Anaheim, CA.

• 資料種別: 図書
• ISBN: 9781509007912 (Print-On-Demand)
• ISSN: 1088-7725
• タイトル: 2016 IEEE AUTOTESTCON : Anaheim, California, USA : 12-15 September 2016 : systems readiness technology conference : conferences of the Institute of Electrical & Electronics Engineers : Sep 2016, Anaheim, CA.
• 著者標目: Autotestcon (2016 : Anaheim, Calif.)
• 出版事項: Piscataway, NJ : IEEE (出版)
• 出版年月日等: [2016]; 著作権日付 : ©2016
• 出版年（W3CDTF）: 2016
• 数量: xxx, 511 pages
• 形態の詳細: illustrations
• 大きさ: 28 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 表現種別: text
• 機器種別: unmediated
• キャリア種別: volume
• 件名標目: Automation--Testing--Congresses.; Automatic test equipment--Congresses.; Maintainability (Engineering)--Congresses.; Testing--Data processing--Congresses.
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Papers and program.; "... welcome to our attendees at the 52nd edition of the Systems Readiness Technology Conference that you all know as IEEE AUTOTESTCON."--Page xvi.; Described as "We start as usual with the Tutorial Program on Monday, offering ... During our Tuesday-through-Thursday main program we have ..."--Page xvii.; "AUTOTESTCON is the world's premier conference ... It is sponsored annually by ..."--Page xxxi.; IEEE catalog number CFP16AUT-POD.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-17-2722
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 028155784; http://id.ndl.go.jp/bib/028155784
• 目録規則: RDA
• 整理区分コード: 215