2016 IEEE AUTOTESTCON : Anaheim, California, USA : 12-15 September 2016 : systems readiness technology conference : conferences of the Institute of Electrical & Electronics Engineers : Sep 2016, Anaheim, CA.

2016 IEEE AUTOTESTCON : Anaheim, California, USA : 12-15 September 2016 : systems readiness technology conference : conferences of the Institute of Electrical & Electronics Engineers : Sep 2016, Anaheim, CA.

Call No. (NDL): M17-17-2722
Bibliographic ID of National Diet Library: 028155784

Material type: 図書

Author: Autotestcon (2016 : Anaheim, Calif.)

Publisher: IEEE

Publication date: [2016]

Material Format: Paper

Capacity, size, etc.: xxx, 511 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Papers and program."... welcome to our attendees at the 52nd edition of the Systems Readiness Technology Conference that you all know as IEEE AUTOTEST...

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781509007912 (Print-On-Demand)
ISSN: 1088-7725
Title: 2016 IEEE AUTOTESTCON : Anaheim, California, USA : 12-15 September 2016 : systems readiness technology conference : conferences of the Institute of Electrical & Electronics Engineers : Sep 2016, Anaheim, CA.
Author Heading: Autotestcon (2016 : Anaheim, Calif.)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2016
Extent: xxx, 511 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Automation--Testing--Congresses.
Automatic test equipment--Congresses.
Maintainability (Engineering)--Congresses.
Testing--Data processing--Congresses.
NDLC: M17
Target Audience: 一般
Note (General): Papers and program.
"... welcome to our attendees at the 52nd edition of the Systems Readiness Technology Conference that you all know as IEEE AUTOTESTCON."--Page xvi.
Described as "We start as usual with the Tutorial Program on Monday, offering ... During our Tuesday-through-Thursday main program we have ..."--Page xvii.
"AUTOTESTCON is the world's premier conference ... It is sponsored annually by ..."--Page xxxi.
IEEE catalog number CFP16AUT-POD.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-17-2722
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028155784
http://id.ndl.go.jp/bib/028155784
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215