2016 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2016) : Storrs, Connecticut, USA : 19-20 September 2016 : Sep 2016, Storrs, CT.
2016 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2016) : Storrs, Connecticut, USA : 19-20 September 2016 : Sep 2016, Storrs, CT.
国立国会図書館請求記号
M17-18-354
国立国会図書館書誌ID
028213697
資料種別
図書
著者
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (29th : 2016 : Storrs, Conn.)
Papers."... we welcome you to twenty-ninth edition of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology System...
"... we welcome you to twenty-ninth edition of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2016) ..."--Foreword.
IEEE catalog number CFP16078-POD.
書誌注記
Includes bibliographical references and author index.