2016 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2016) : Storrs, Connecticut, USA : 19-20 September 2016 : Sep 2016, Storrs, CT.

• Material Type: 図書
• ISBN: 9781509036240 (print-on-demand)
• ISSN: 1550-5774
• Title: 2016 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2016) : Storrs, Connecticut, USA : 19-20 September 2016 : Sep 2016, Storrs, CT.
• Author Heading: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (29th : 2016 : Storrs, Conn.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2016]; 著作権日付 : ©2016
• Publication Date (W3CDTF): 2016
• Extent: vii, 159 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Integrated circuits--Very large scale integration--Congresses.; Nanotechnology--Congresses.; Integrated circuits--Fault tolerance--Congresses.; Integrated circuits--Fault tolerance.; Integrated circuits--Very large scale integration.; Nanotechnology.
• LCC: TK7874.75
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; "... we welcome you to twenty-ninth edition of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2016) ..."--Foreword.; IEEE catalog number CFP16078-POD.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-18-354
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028213697; http://id.ndl.go.jp/bib/028213697
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215