2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.

• 資料種別: 図書
• ISBN: 9781467382601 (Print-On-Demand)
• ISSN: 1946-1542
• タイトル: 2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.
• 著者標目: International Symposium on the Physical & Failure Analysis of Integrated Circuits (23rd : 2016 : Marina Bay, Singapore); Institute of Electrical and Electronics Engineers.; IEEE Reliability/CPMT/ED Singapore Chapter.
• 出版事項: Piscataway, NJ : IEEE (出版)
• 出版年月日等: [2016]; 著作権日付 : ©2016
• 出版年（W3CDTF）: 2016
• 数量: xxxix, 438 pages
• 形態の詳細: illustrations
• 大きさ: 28 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• ジャンル・形式用語: Conference papers and proceedings.
• 表現種別: text
• 機器種別: unmediated
• キャリア種別: volume
• 件名標目: Integrated circuits--Reliability--Congresses.; Integrated circuits--Testing--Congresses.; Semiconductors--Failures--Congresses.; Integrated circuits--Defects--Congresses.; Integrated circuits--Defects.; Integrated circuits--Reliability.; Integrated circuits--Testing.; Semiconductors--Failures.
• LCC: TK7874
• NDLC: M17
• 対象利用者: 一般
• 一般注記: Abstracts and papers.; Described as "During the 3-day symposium, ... The Day 1 of IPFA is devoted to tutorials involving 6 short educational courses."--Welcome message.; IEEE catalog number CFP16777-POD.
• 書誌注記: Includes bibliographical references.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-18-1168
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 028386032; http://id.ndl.go.jp/bib/028386032
• 目録規則: RDA
• 整理区分コード: 215