2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.

• Material Type: 図書
• ISBN: 9781467382601 (Print-On-Demand)
• ISSN: 1946-1542
• Title: 2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.
• Author Heading: International Symposium on the Physical & Failure Analysis of Integrated Circuits (23rd : 2016 : Marina Bay, Singapore); Institute of Electrical and Electronics Engineers.; IEEE Reliability/CPMT/ED Singapore Chapter.
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2016]; 著作権日付 : ©2016
• Publication Date (W3CDTF): 2016
• Extent: xxxix, 438 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Integrated circuits--Reliability--Congresses.; Integrated circuits--Testing--Congresses.; Semiconductors--Failures--Congresses.; Integrated circuits--Defects--Congresses.; Integrated circuits--Defects.; Integrated circuits--Reliability.; Integrated circuits--Testing.; Semiconductors--Failures.
• LCC: TK7874
• NDLC: M17
• Target Audience: 一般
• Note (General): Abstracts and papers.; Described as "During the 3-day symposium, ... The Day 1 of IPFA is devoted to tutorials involving 6 short educational courses."--Welcome message.; IEEE catalog number CFP16777-POD.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: M17-18-1168
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028386032; http://id.ndl.go.jp/bib/028386032
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215