2016 20th international symposium on VLSI design and test (VDAT 2016) : Guwahati, India : 24-27 May 2016 : May 2016, Guwahati, India.

• 資料種別: 図書
• ISBN: 9781509014231 (Print-On-Demand)
• タイトル: 2016 20th international symposium on VLSI design and test (VDAT 2016) : Guwahati, India : 24-27 May 2016 : May 2016, Guwahati, India.
• 著者標目: VDAT (Symposium) (20th : 2016 : Gauhati, India); Indian Institute of Technology, Guwahati.
• 出版事項: Piscataway, NJ : IEEE (出版)
• 出版年月日等: [2016]
• 出版年（W3CDTF）: 2016
• 数量: 219 pages
• 形態の詳細: illustrations
• 大きさ: 28 cm
• 出版地（国名コード）: US
• 本文の言語コード: eng
• ジャンル・形式用語: Conference papers and proceedings.
• 表現種別: text
• 機器種別: unmediated
• キャリア種別: volume
• 件名標目: Integrated circuits--Very large scale integration--Testing--Congresses.; Integrated circuits--Very large scale integration--Design and construction--Congresses.; Embedded computer systems--Congresses.; Embedded computer systems.; Integrated circuits--Very large scale integration--Design and construction.; Integrated circuits--Very large scale integration--Testing.
• LCC: TK7874.75
• NDLC: M17
• 対象利用者: 一般
• 対象利用者に関する注記: Scholarly & Professional
• 一般注記: Abstracts and papers.; "... 20th International Symposium on VLSI Design and Test (VDAT) 2016. This annual event has emerged as ..."--Program chairs message.; "A one-day tutorial program precedes the main symposium and includes one full day and six half day tutorials."--Program chairs message.; IEEE catalog number CFP1672Y-POD.
• 資料の内容に関する注記: The 20th International VDAT Symposium will bring together industry and academia to present cutting edge technologies in various areas of VLSI Design and Test including (but not limited to) VLSI Design and Semiconductor Device Modeling, Emerging Technology, Testing and Verification, Embedded Systems.
• 書誌注記: Includes bibliographical references.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-19-737
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 028803368; http://id.ndl.go.jp/bib/028803368
• 目録規則: RDA
• 整理区分コード: 215