2016 20th international symposium on VLSI design and test (VDAT 2016) : Guwahati, India : 24-27 May 2016 : May 2016, Guwahati, India.

Call No. (NDL): M17-19-737
Bibliographic ID of National Diet Library: 028803368

Material type: 図書

Author: VDAT (Symposium) (20th : 2016 : Gauhati, India)ほか

Publisher: IEEE

Publication date: [2016]

Material Format: Paper

Capacity, size, etc.: 219 pages ; 28 cm

NDC: -

View All

Notes on use

Note (General)：: Abstracts and papers."... 20th International Symposium on VLSI Design and Test (VDAT) 2016. This annual event has emerged as ..."--Program chairs mess...

Other physical details：: illustrations

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 9781509014231 (Print-On-Demand)
Title: 2016 20th international symposium on VLSI design and test (VDAT 2016) : Guwahati, India : 24-27 May 2016 : May 2016, Guwahati, India.
Author Heading: VDAT (Symposium) (20th : 2016 : Gauhati, India)
Indian Institute of Technology, Guwahati.
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date: [2016]
Publication Date (W3CDTF): 2016
Extent: 219 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Integrated circuits--Very large scale integration--Testing--Congresses.
Integrated circuits--Very large scale integration--Design and construction--Congresses.
Embedded computer systems--Congresses.
Embedded computer systems.
Integrated circuits--Very large scale integration--Design and construction.
Integrated circuits--Very large scale integration--Testing.
LCC: TK7874.75
NDLC: M17
Target Audience: 一般
Note (Target Audience): Scholarly & Professional
Note (General): Abstracts and papers.
"... 20th International Symposium on VLSI Design and Test (VDAT) 2016. This annual event has emerged as ..."--Program chairs message.
"A one-day tutorial program precedes the main symposium and includes one full day and six half day tutorials."--Program chairs message.
IEEE catalog number CFP1672Y-POD.
Note (Content): The 20th International VDAT Symposium will bring together industry and academia to present cutting edge technologies in various areas of VLSI Design and Test including (but not limited to) VLSI Design and Semiconductor Device Modeling, Emerging Technology, Testing and Verification, Embedded Systems.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-19-737
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028803368
http://id.ndl.go.jp/bib/028803368
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215