Proceedings : 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 10-13 October 2004, Cannes, France

• 資料種別: 図書
• ISBN: 0769522416
• タイトル: Proceedings : 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 10-13 October 2004, Cannes, France
• 著者・編者: [edited by R. Aitken, ... [et al.] ] ; sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing (TCFTC), IEEE Computer Society Test Technology Technical Council (TTTC)
• 著者標目: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; https://ci.nii.ac.jp/author/DA1185577X; IEEE Computer Society. Test Technology Technical Council; https://ci.nii.ac.jp/author/DA1250352X; IEEE Computer Society. Technical Committee on Fault-Tolerant Computing; https://ci.nii.ac.jp/author/DA00923007; IEEE Computer Society; https://ci.nii.ac.jp/author/DA00479199; Aitken, R.
• 出版事項: IEEE Computer Society
• 出版年月日等: c2004
• 出版年（W3CDTF）: 2004
• 大きさ: 23 cm
• 並列タイトル等: 2004 Proceedings : the 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; DFT2004; P2241
• 出版地（国名コード）: us
• 本文の言語コード: en
• 対象利用者: 一般
• 一般注記: Includes bibliographical references and index; "IEEE Computer Society Press Order Number P2241" -- T.p. verso
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA70206296#entity
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA70206296 : BA70206296