図書

Proceedings : 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 10-13 October 2004, Cannes, France

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Proceedings : 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 10-13 October 2004, Cannes, France

Material type
図書
Author
[edited by R. Aitken, ... [et al.] ] ; sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing (TCFTC), IEEE Computer Society Test Technology Technical Council (TTTC)
Publisher
IEEE Computer Society
Publication date
c2004
Material Format
Paper
Capacity, size, etc.
23 cm
NDC
-
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Notes on use

Note (General):

Includes bibliographical references and index"IEEE Computer Society Press Order Number P2241" -- T.p. verso

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Paper

Material Type
図書
ISBN
0769522416
Author/Editor
[edited by R. Aitken, ... [et al.] ] ; sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing (TCFTC), IEEE Computer Society Test Technology Technical Council (TTTC)
Publication, Distribution, etc.
Publication Date
c2004
Publication Date (W3CDTF)
2004
Size
23 cm
Alternative Title
2004 Proceedings : the 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
DFT2004
P2241