Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices :ECS

• 資料種別: 図書
• ISBN: 1566772397; 0819434973
• タイトル: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
• 巻次・部編番号: :ECS; :SPIE
• 著者・編者: editors, Bernd O. Kolbesen ... [et al.]. ; sponsored by the Electrochemical Society, Inc., Electronics Division
• 著者標目: ALTECH 99 (1999 : Leuven, Belgium); Kolbesen, Bernd O.; https://ci.nii.ac.jp/author/DA07746930; Electrochemical Society. Electronics Division; https://ci.nii.ac.jp/author/DA0357072X; Electrochemical Society. Meeting; https://ci.nii.ac.jp/author/DA03398898; 電気化学協会 デンキ カガク キョウカイ; https://ci.nii.ac.jp/author/DA00115986; Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (1999 : Honolulu, Hawaii); European Solid State Device Research Conference; https://ci.nii.ac.jp/author/DA00938219
• 出版事項: Electrochemical Society
• 出版年月日等: c1999
• 出版年（W3CDTF）: 1999
• 大きさ: 24 cm
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Semiconductors -- Analysis Congresses
• LCC: QD139.S44
• 対象利用者: 一般
• 一般注記: ALTECH 99 was held Sept. 16-17, 1999, jointly with ESSDERC 99, the 29th European Solid State Device Research Conference, and the ECS Symposium on Diagnostic Techniques for Semiconductor Materials and Devices was held as part of the 1999 Joint International Meeting, 196th Meeting of the Electrochemical Society and the 1999 Fall Meeting of the Electrochemical Society of Japan, Honolulu, Hawaii, Oct. 17-22; "Published in cooperation with the International Society for Optical Engineering."; Includes bibliographical references and indexes
• 関連情報: Proceedings; https://cir.nii.ac.jp/crid/1130282269217551104; https://cir.nii.ac.jp/crid/1130282269273401728
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA66924911#entity; https://lccn.loc.gov/99065160
• 掲載誌: Proceedings; https://cir.nii.ac.jp/crid/1130282269217551104; https://cir.nii.ac.jp/crid/1130282269273401728
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA66924911 : BA66924911
• LC control number: 99065160; https://lccn.loc.gov/99065160