Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices :ECS :SPIE

Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices :ECS

Material type: 図書

Author: editors, Bernd O. Kolbesen ... [et al.]. ; sponsored by the Electrochemical Society, Inc., Electronics Division

Publisher: Electrochemical Society

Publication date: c1999

Material Format: Paper

Capacity, size, etc.: 24 cm

NDC: -

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Note (General)：: ALTECH 99 was held Sept. 16-17, 1999, jointly with ESSDERC 99, the 29th European Solid State Device Research Conference, and the ECS Symposium on Diag...

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Paper

Material Type: 図書
ISBN: 1566772397
0819434973
Title: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Volume: :ECS
:SPIE
Author/Editor: editors, Bernd O. Kolbesen ... [et al.]. ; sponsored by the Electrochemical Society, Inc., Electronics Division
Author Heading: ALTECH 99 (1999 : Leuven, Belgium)
Kolbesen, Bernd O.
https://ci.nii.ac.jp/author/DA07746930
Electrochemical Society. Electronics Division
https://ci.nii.ac.jp/author/DA0357072X
Electrochemical Society. Meeting
https://ci.nii.ac.jp/author/DA03398898
電気化学協会デンキカガクキョウカイ
https://ci.nii.ac.jp/author/DA00115986
Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (1999 : Honolulu, Hawaii)
European Solid State Device Research Conference
https://ci.nii.ac.jp/author/DA00938219
Publication, Distribution, etc.: Electrochemical Society
Publication Date: c1999
Publication Date (W3CDTF): 1999
Size: 24 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Semiconductors -- Analysis Congresses
LCC: QD139.S44
Target Audience: 一般
Note (General): ALTECH 99 was held Sept. 16-17, 1999, jointly with ESSDERC 99, the 29th European Solid State Device Research Conference, and the ECS Symposium on Diagnostic Techniques for Semiconductor Materials and Devices was held as part of the 1999 Joint International Meeting, 196th Meeting of the Electrochemical Society and the 1999 Fall Meeting of the Electrochemical Society of Japan, Honolulu, Hawaii, Oct. 17-22
"Published in cooperation with the International Society for Optical Engineering."
Includes bibliographical references and indexes
Related Material: Proceedings
https://cir.nii.ac.jp/crid/1130282269217551104
Proceedings
https://cir.nii.ac.jp/crid/1130282269273401728
Related Material (URI): https://ci.nii.ac.jp/ncid/BA66924911#entity
https://lccn.loc.gov/99065160
Periodical Title: Proceedings
https://cir.nii.ac.jp/crid/1130282269217551104
Proceedings
https://cir.nii.ac.jp/crid/1130282269273401728
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA66924911 : BA66924911
LC Control Number: 99065160
https://lccn.loc.gov/99065160