半導体パッケージ基板...

半導体パッケージ基板用無電解Ni/Pd/Auめっき技術(第1報)はんだボール接続信頼性に及ぼす無電解Niめっき膜厚の影響

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半導体パッケージ基板用無電解Ni/Pd/Auめっき技術(第1報)はんだボール接続信頼性に及ぼす無電解Niめっき膜厚の影響

Call No. (NDL)
Z74-B258
Bibliographic ID of National Diet Library
023436350
Material type
記事
Author
江尻 芳則ほか
Publisher
東京 : エレクトロニクス実装学会
Publication date
2012-01
Material Format
Paper
Journal name
エレクトロニクス実装学会誌 = Journal of the Japan Institute of Electronics Packaging 15(1)=98:2012.1
Publication Page
p.82-95
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Paper Digital

Material Type
記事
Author/Editor
江尻 芳則
櫻井 健久
荒山 貴慎 他
Alternative Title
Electroless Ni/Pd/Au Plating for Semiconductor Package Substrates (1) Influence of the Electroless Ni Plating Thickness on the Solder Ball Joint Reliability
Periodical title
エレクトロニクス実装学会誌 = Journal of the Japan Institute of Electronics Packaging
No. or year of volume/issue
15(1)=98:2012.1
Volume
15
Issue
1
Sequential issue number
98