転位組織解析のためのSEM-ECCI法の応用

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Material Type: 記事
Title: 転位組織解析のためのSEM-ECCI法の応用
Author/Editor: 杉山昌章
重里元一
Author Heading: 杉山昌章
重里元一
Alternative Title: Application of Electron Channeling Contrast Imaging in a Scanning Electron Microscope for Dislocation Analysis
Periodical title: 顕微鏡 = Microscopy / 「顕微鏡」編集委員会編
No. or year of volume/issue: 48(3):2013
Volume: 48
Issue: 3
Pages: 216-220
Publication date of volume/issue (W3CDTF): 2013
ISSN (Periodical Title): 1349-0958
ISSN-L (Periodical Title): 1349-0958
Publication (Periodical Title): 東京 : 日本顕微鏡学会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: SEM
ECCI
反射電子
転位
鉄鋼材料
NDLC: ZN33
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-896
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 025156330
http://id.ndl.go.jp/bib/025156330
Bibliographic Record Category (NDL): 632