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Frequency Dependence of the Defect Sensitivity of Guided Wave Testing for Efficient Defect Detection at Pipe Elbows

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Frequency Dependence of the Defect Sensitivity of Guided Wave Testing for Efficient Defect Detection at Pipe Elbows

Call No. (NDL)
Z53-J286
Bibliographic ID of National Diet Library
027195101
Material type
記事
Author
Toshihiro Yamamotoほか
Publisher
Sendai : The Japan Institute of Metals and Materials ; 2001-
Publication date
2016-03
Material Format
Paper
Journal name
Materials transactions 57(3):2016.3
Publication Page
p.397-403
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Paper

Material Type
記事
Author/Editor
Toshihiro Yamamoto
Takashi Furukawa
Hideo Nishino
Periodical title
Materials transactions
No. or year of volume/issue
57(3):2016.3
Volume
57
Issue
3
Pages
397-403
Publication date of volume/issue (W3CDTF)
2016-03