オペランド硬X線光電子分光法によるSiO₂/4H-SiC界面の界面準位のエネルギー分布観測 (第36回表面科学学術講演会特集号(1))
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- Material Type
- 記事
- Author/Editor
- 山下 良之蓮沼 隆長田 貴弘知京 豊祐
- Series Title
- Alternative Title
- Direct Observation of the Energy Distribution of Interface States at SiO₂/4H-SiC Interface : Operando Hard X-ray Photoelectron Spectroscopic Study
- Periodical title
- 表面科学 = Journal of the Surface Science Society of Japan / 日本表面科学会 編
- No. or year of volume/issue
- 38(7):2017.7
- Volume
- 38
- Issue
- 7