Sn-Ag-Bi-In-Cu系はんだの接合信頼性に及ぼす熱サイクル負荷とSb添加の影響

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Sn-Ag-Bi-In-Cu系はんだの接合信頼性に及ぼす熱サイクル負荷とSb添加の影響

Call No. (NDL)
Z16-1617
Bibliographic ID of National Diet Library
028549568
Material type
記事
Author
三原 一樹ほか
Publisher
東京 : エレクトロニクス実装学会
Publication date
2017-08
Material Format
Paper
Journal name
マイクロエレクトロニクスシンポジウム論文集 27:2017.8.29・30
Publication Page
p.157-160
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Paper Digital

Material Type
記事
Author/Editor
三原 一樹
日根 清裕
酒谷 茂昭
秋山 真之介
上西 啓介
Alternative Title
The Effect of Thermal Cycle and Addition of Sb on Joint Reliability of Sn-Ag-Bi-In-Cu Solder
Periodical title
マイクロエレクトロニクスシンポジウム論文集
No. or year of volume/issue
27:2017.8.29・30
Volume
27
Pages
157-160
Publication date of volume/issue (W3CDTF)
2017-08