モノクロメーター搭載STEM-EELSによる局所電子状態分析
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- Material Type
- 記事
- Author/Editor
- 治田 充貴倉田 博基
- Alternative Title
- Local Electronic State Analysis by Monochromated STEM-EELS
- Periodical title
- 顕微鏡 = Microscopy / 「顕微鏡」編集委員会 編
- No. or year of volume/issue
- 56(2):2021
- Volume
- 56
- Issue
- 2
- Pages
- 73-80