雑誌電気学会研究会資料 DEI
Volume number2024(1-12):2024.1.19
Article計測環境が二次電子放...

計測環境が二次電子放出係数に与える影響 (誘電・絶縁材料/放電・プラズマ・パルスパワー/高電圧合同研究会・放電・プラズマ・パルスパワー,高電圧,誘電・絶縁材料)

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計測環境が二次電子放出係数に与える影響

(誘電・絶縁材料/放電・プラズマ・パルスパワー/高電圧合同研究会・放電・プラズマ・パルスパワー,高電圧,誘電・絶縁材料)

Call No. (NDL)
Z43-227
Bibliographic ID of National Diet Library
033323708
Material type
記事
Author
劔持 祥星ほか
Publisher
東京 : 電気学会
Publication date
2024-01-19
Material Format
Paper
Journal name
電気学会研究会資料. DEI 2024(1-12):2024.1.19
Publication Page
p.13-17
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Paper

Material Type
記事
Title
計測環境が二次電子放出係数に与える影響
Author/Editor
劔持 祥星
三宅 弘晃
田中 康寛
Series Title
誘電・絶縁材料/放電・プラズマ・パルスパワー/高電圧合同研究会・放電・プラズマ・パルスパワー,高電圧,誘電・絶縁材料
Author Heading
劔持 祥星
三宅 弘晃
田中 康寛
Alternative Title
Effect of Measurement Environment on Secondary Electron Emission Yield
Periodical title
電気学会研究会資料. DEI
No. or year of volume/issue
2024(1-12):2024.1.19
Volume
2024
Issue
1-12