Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 原田 俊太村山 健太
- Alternative Title
- Polarized Light Observation for Visualization of Crystalline Defects in SiC Wafers for Power Device Applications
- Periodical title
- まてりあ = Materia Japan
- No. or year of volume/issue
- 63(10):2024.10
- Volume
- 63
- Issue
- 10
- Pages
- 687-694