CMOSゲート回路を断線センサとして用いた部品接合不良検出法
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- Material Type
- 記事
- Author/Editor
- 小野 安季良一宮 正博四柳 浩之 他
- Alternative Title
- Open lead detection method by sensing the switching current of CMOS gate on sensing probe
- Periodical title
- エレクトロニクス実装学会誌 = Journal of the Japan Institute of Electronics Packaging
- No. or year of volume/issue
- 12(2) (通号 78) 2009.3
- Volume
- 12
- Issue
- 2
- Sequential issue number
- 78