原子間力顕微鏡における制御応用とその展望 (ナノ・マイクロテクノロジーの制御理論と応用特集号)

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原子間力顕微鏡における制御応用とその展望(ナノ・マイクロテクノロジーの制御理論と応用特集号)

Call No. (NDL)
Z14-195
Bibliographic ID of National Diet Library
10246521
Material type
記事
Author
山末 耕平ほか
Publisher
京都 : システム制御情報学会
Publication date
2009
Material Format
Paper
Journal name
システム・制御・情報 = Systems, control and information : システム制御情報学会誌 53(6) 2009
Publication Page
p.236~242
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Paper Digital

Material Type
記事
Author/Editor
山末 耕平
引原 隆士
Alternative Title
Recent trends and perspectives on control application in atomic force microscopy
Periodical title
システム・制御・情報 = Systems, control and information : システム制御情報学会誌
No. or year of volume/issue
53(6) 2009
Volume
53
Issue
6