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プラズマ発光分光分析...

プラズマ発光分光分析によるGaN電子サイクロトロン共鳴プラズマ励起分子線エピタキシャル成長の観察

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プラズマ発光分光分析によるGaN電子サイクロトロン共鳴プラズマ励起分子線エピタキシャル成長の観察

Call No. (NDL)
Z16-474
Bibliographic ID of National Diet Library
4750737
Material type
記事
Author
千葉 恭男ほか
Publisher
東京 : 日本真空協会
Publication date
1999-04
Material Format
Paper
Journal name
真空 = Journal of the Vacuum Society of Japan 42(4) 1999.04
Publication Page
p.530~534
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Paper

Material Type
記事
Author/Editor
千葉 恭男
冨成 達也
名西 〔ヤス〕之
Periodical title
真空 = Journal of the Vacuum Society of Japan
No. or year of volume/issue
42(4) 1999.04
Volume
42
Issue
4
Pages
530~534
Publication date of volume/issue (W3CDTF)
1999-04
ISSN (Periodical Title)
0559-8516
ISSN-L (Periodical Title)
0559-8516
Publication (Periodical Title)
東京 : 日本真空協会
Place of Publication (Country Code)
JP
Text Language Code
jpn
NDLC
Target Audience
一般
Holding library
国立国会図書館
Call No.
Z16-474
Data Provider (Database)
国立国会図書館 : 国立国会図書館雑誌記事索引
Bibliographic ID (NDL)
4750737
Bibliographic Record Category (NDL)
632

Digital

Summary, etc.
We observed excited species near a substrate during GaN growth by optical emission spectroscopy (OES). Both GaN growth rate and excited Ga emission intensity were studied by varying substrate bias conditions. Decrease in Ga emission intensity under high positive bias condition can be explained by suppression of Ga desorption. Thus, OES is considered to be a useful tool to understand GaN growth mechanism in ECR plasma-excited MBE.<BR>We also demonstrated GaN growth using helium-nitrogen mixed gas plasma. It was found that, compared with the GaN growth using nitrogen plasma without helium, the GaN growth rate was increased by using the mixed gas plasma.
DOI
10.3131/jvsj.42.530
Access Restrictions
インターネット公開
Data Provider (Database)
科学技術振興機構 : J-STAGE

Digital

Summary, etc.
We observed excited species near a substrate during GaN growth by optical emission spectroscopy (OES). Both GaN growth rate and excited Ga emission intensity were studied by varying substrate bias conditions. Decrease in Ga emission intensity under high positive bias condition can be explained by suppression of Ga desorption. Thus, OES is considered to be a useful tool to understand GaN growth mechanism in ECR plasma-excited MBE.<BR>We also demonstrated GaN growth using helium-nitrogen mixed gas plasma. It was found that, compared with the GaN growth using nitrogen plasma without helium, the GaN growth rate was increased by using the mixed gas plasma.
Access Restrictions
インターネット公開
Data Provider (Database)
国立情報学研究所 : CiNii Research
Original Data Provider (Database)
Japan Link Center
雑誌記事索引データベース
Crossref
CiNii Articles
Bibliographic ID (NDL)
4750737
NAID
10002476985