On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper

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On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper

Call No. (NDL)
Z53-T76
Bibliographic ID of National Diet Library
4835461
Material type
記事
Author
Michael L. Jenkinsほか
Publisher
Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
Publication date
1999
Material Format
Paper
Journal name
Journal of electron microscopy 48(4) 1999
Publication Page
p.323~332
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Paper

Material Type
記事
Author/Editor
Michael L. Jenkins
Marquis A. Kirk
Hiroshi Fukushima
Periodical title
Journal of electron microscopy
No. or year of volume/issue
48(4) 1999
Volume
48
Issue
4
Pages
323~332
Publication date of volume/issue (W3CDTF)
1999