Journal of electron microscopy

• Material Type: 雑誌
• ISSN: 0022-0744
• Title: Journal of electron microscopy
• Volume: 48(1)-48(6) 19990000-19990000
• Publication, Distribution, etc.: Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
• Publication Date: 1999
• Publication Date (W3CDTF): 1999
• Place of Publication (Country Code): GB
• Text Language Code: eng
• NDLC: ZN33
• Note (General): Vol.22, n.1-vol.45, n.6, published by Japanese Society of Electron Microscopy in Tokyo
• Holding library: 国立国会図書館
• Call No.: Z53-T76
• Replaces: 継続前; https://ndlsearch.ndl.go.jp/books/R100000002-I000000015810
• Continues: 継続後 : Microscopy (ISSN:2050-5698); https://ndlsearch.ndl.go.jp/books/R100000002-I024336909
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000000129291; http://id.ndl.go.jp/bib/000000129291
• Cataloging Rule: Nippon Cataloguing Rules 1987 Revised Edition
• Bibliographic Record Category (NDL): 231

Table of Contents

HAFN Special Issue

Localized valence spectroscopy of complex nanostructures (HAFN Special Issue)

Oxides:neutron and synchrotron X-ray diffraction studies (HAFN Special Issue)

Structure and chemistry of planar defects in bulk and thin film MoSi2 (HAFN Special Issue)

New fullerenes in the B-C-N system:synthesis and analysis by an electron beam (HAFN Special Issue)

Cell-cell Organization and Functions of'Sinusoids'in Liver Microcirculation System

Unified Reprsentation of Optical Properties for Electrostatic Lenses

Structural Studies of Monoclinic Approximants of Al13Fe4 and τ2-Inflated Al13Co4 by the High-angle Annular Dark-field Method

Magnification and Scanning Time Dependence of Secondary Electron Image Contrast of Ferroelectric Domains in Aged Triglycine Sulphate Crystal

Microstructure of Tough Polycrystalline Natural Diamond

Detection of the Flip-Flop Motion of Buckled Dimers on a Ge(001) Surface by STM

Visualization of Carbon in Steels Using Energy Filtering TEM

Elastic-Filtered Electron Diffraction for Structure Determination of AlN Specimen

Contrast Transfer Function under Convergent Beam Illumination Measured by Field Emission Gun

Evaluation of Image Drift Correction by Three-Dimensional Fourier Analysis

Four generations of high-voltage electron microscopes

High-resolution in-situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system

On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper

Changes in the long range ordered structure of Ag-Zn-Al alloys

Helicity and inter-tube bonding in bundles of single-walled carbon nanotubes

The importance and applications of ultra-high voltage electron microscopy to materials science

Do cracks melt their way through solids?

Particularities of high-voltage electron microscopy:instrument design,defect imaging and in situ investigation in'thick'specimens

Novel phenomena of irradiation damage in FCC metals irradiated with high-energy electrons at low temperatures

Xe precipitates at grain boundaries in Al under 1 MeV electron irradiation

High-voltage, high-resolution electron microscopy study on thin sections of phase change optical disk prepared by an ultramicrotome

A beam separator with small aberrations

Strategies for low- and very-low-energy SEM

Application of the CBED method for the determination of lattice parameters of cubic SiC films on 6H SiC substrates

Optimization of TEM specimen preparation by double-sided ion beam thinning under low angles