Journal of electron microscopy

• 資料種別: 雑誌
• ISSN: 0022-0744
• タイトル: Journal of electron microscopy
• 巻次・部編番号: 48(1)-48(6) 19990000-19990000
• 出版事項: Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
• 出版年月日等: 1999
• 出版年（W3CDTF）: 1999
• 出版地（国名コード）: GB
• 本文の言語コード: eng
• NDLC: ZN33
• 一般注記: Vol.22, n.1-vol.45, n.6, published by Japanese Society of Electron Microscopy in Tokyo
• 所蔵機関: 国立国会図書館
• 請求記号: Z53-T76
• 改題前: 継続前; https://ndlsearch.ndl.go.jp/books/R100000002-I000000015810
• 改題後: 継続後 : Microscopy (ISSN:2050-5698); https://ndlsearch.ndl.go.jp/books/R100000002-I024336909
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000000129291; http://id.ndl.go.jp/bib/000000129291
• 目録規則: 日本目録規則1987年版改訂版
• 整理区分コード: 231

目次

HAFN Special Issue

Localized valence spectroscopy of complex nanostructures (HAFN Special Issue)

Oxides:neutron and synchrotron X-ray diffraction studies (HAFN Special Issue)

Structure and chemistry of planar defects in bulk and thin film MoSi2 (HAFN Special Issue)

New fullerenes in the B-C-N system:synthesis and analysis by an electron beam (HAFN Special Issue)

Cell-cell Organization and Functions of'Sinusoids'in Liver Microcirculation System

Unified Reprsentation of Optical Properties for Electrostatic Lenses

Structural Studies of Monoclinic Approximants of Al13Fe4 and τ2-Inflated Al13Co4 by the High-angle Annular Dark-field Method

Magnification and Scanning Time Dependence of Secondary Electron Image Contrast of Ferroelectric Domains in Aged Triglycine Sulphate Crystal

Microstructure of Tough Polycrystalline Natural Diamond

Detection of the Flip-Flop Motion of Buckled Dimers on a Ge(001) Surface by STM

Visualization of Carbon in Steels Using Energy Filtering TEM

Elastic-Filtered Electron Diffraction for Structure Determination of AlN Specimen

Contrast Transfer Function under Convergent Beam Illumination Measured by Field Emission Gun

Evaluation of Image Drift Correction by Three-Dimensional Fourier Analysis

Four generations of high-voltage electron microscopes

High-resolution in-situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system

On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper

Changes in the long range ordered structure of Ag-Zn-Al alloys

Helicity and inter-tube bonding in bundles of single-walled carbon nanotubes

The importance and applications of ultra-high voltage electron microscopy to materials science

Do cracks melt their way through solids?

Particularities of high-voltage electron microscopy:instrument design,defect imaging and in situ investigation in'thick'specimens

Novel phenomena of irradiation damage in FCC metals irradiated with high-energy electrons at low temperatures

Xe precipitates at grain boundaries in Al under 1 MeV electron irradiation

High-voltage, high-resolution electron microscopy study on thin sections of phase change optical disk prepared by an ultramicrotome

A beam separator with small aberrations

Strategies for low- and very-low-energy SEM

Application of the CBED method for the determination of lattice parameters of cubic SiC films on 6H SiC substrates

Optimization of TEM specimen preparation by double-sided ion beam thinning under low angles