重イオンによるマイクロ粒子励起X線(PIXE)分析法とその応用(関西支部企画特集「極微量物質の及ぼす影響とその評価」)

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Material Type: 記事
Title: 重イオンによるマイクロ粒子励起X線(PIXE)分析法とその応用
Author/Editor: 杢野由明
堀野裕治
Series Title: 関西支部企画特集「極微量物質の及ぼす影響とその評価」
Author Heading: 杢野由明
堀野裕治
Periodical title: 真空 = Journal of the Vacuum Society of Japan
No. or year of volume/issue: 43(11) 2000.11
Volume: 43
Issue: 11
Pages: 1036～1041
Publication date of volume/issue (W3CDTF): 2000-11
ISSN (Periodical Title): 0559-8516
ISSN-L (Periodical Title): 0559-8516
Publication (Periodical Title): 東京 : 日本真空協会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZN15
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-474
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 5593484
http://id.ndl.go.jp/bib/5593484
Bibliographic Record Category (NDL): 632