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Correspondence between Surface Morphological Faults and Crystallographic Defects in 4H-SiC Homoepitaxial Film

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Correspondence between Surface Morphological Faults and Crystallographic Defects in 4H-SiC Homoepitaxial Film

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
6357872
Material type
記事
Author
Tatsuya Okadaほか
Publisher
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
Publication date
2002-11
Material Format
Digital
Journal name
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 41(11A) (通号 566) 2002.11
Publication Page
p.6320~6326
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Detailed bibliographic record

Summary, etc.:

Conventional transmission electron microscopy was applied to study the nature of crystallographic defects under some types of surface morphological fa...

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Bibliographic Record

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Digital

Material Type
記事
Author/Editor
Tatsuya Okada
Tsunenobu Kimoto
Hiroshi Noda 他
Periodical title
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
No. or year of volume/issue
41(11A) (通号 566) 2002.11
Volume
41
Issue
11A
Sequential issue number
566
Pages
6320~6326