Comparison of Silicon-on-Insulator Wafer Mappings between Photoluminescence Intensity and Microwave Photoconductivity Decay Lifetime
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- Material Type
- 記事
- Author/Editor
- Michio TajimaZhiqiang LiShingo Sumie 他
- Author Heading
- Periodical title
- Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
- No. or year of volume/issue
- 43(2) (通号 588) 2004.2
- Volume
- 43
- Issue
- 2
- Sequential issue number
- 588
- Pages
- 432～438