先端デバイスの故障メカニズムと寿命分布(特集信頼性・保全性・安全性の事例--信頼性ハンドブック出版から10年を経て(材料・部品・デバイス編))

Journal name: 信頼性 = The journal of Reliability Engineering Association of Japan : 日本信頼性学会誌 30(8) (通号 172) 2008.11

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Digital
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 記事
Title: 先端デバイスの故障メカニズムと寿命分布
Author/Editor: 横川慎二
Series Title: 特集信頼性・保全性・安全性の事例--信頼性ハンドブック出版から10年を経て(材料・部品・デバイス編)
Author Heading: 横川慎二
Alternative Title: Failure mechanisms and lifetime distributions of advanced devices
Periodical title: 信頼性 = The journal of Reliability Engineering Association of Japan : 日本信頼性学会誌
No. or year of volume/issue: 30(8) (通号 172) 2008.11
Volume: 30
Issue: 8
Sequential issue number: 172
Pages: 644～651
Publication date of volume/issue (W3CDTF): 2008-11
ISSN (Periodical Title): 0919-2697
ISSN-L (Periodical Title): 0919-2697
Publication (Periodical Title): 東京 : 日本信頼性学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM1
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z14-2023
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 9723907
http://id.ndl.go.jp/bib/9723907
Bibliographic Record Category (NDL): 632