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Volume number18(3)(50)
同位体分離器による基...

同位体分離器による基礎的データ-1-固体表面のイオン衝撃による二次電子放出率とイオン自己反射率の測定 固体内反跳イオン研究のモデル的方法

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同位体分離器による基礎的データ-1-固体表面のイオン衝撃による二次電子放出率とイオン自己反射率の測定 固体内反跳イオン研究のモデル的方法

Call No. (NDL)
Z17-213
Bibliographic ID of National Diet Library
8235965
Material type
記事
Author
荒谷 美智
Publisher
東京 : 日本質量分析学会
Publication date
1970-09
Material Format
Digital
Journal name
質量分析 18(3) 1970.09
Publication Page
p.1169~1176
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Detailed bibliographic record

Summary, etc.:

Measurements were made of emission of secondary electrons and self-reflection of ions from the targets bombarded with 10-25kV accelerated ion beams av...

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Bibliographic Record

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Digital

Material Type
記事
Author/Editor
荒谷 美智
Author Heading
Periodical title
質量分析
No. or year of volume/issue
18(3) 1970.09
Volume
18
Issue
3
Pages
1169~1176
Publication date of volume/issue (W3CDTF)
1970-09
ISSN (Periodical Title)
0542-8645
ISSN-L (Periodical Title)
0542-8645
Publication (Periodical Title)
東京 : 日本質量分析学会
Place of Publication (Country Code)
JP
Text Language Code
jpn
NDLC
Target Audience
一般
Collection (Materials For Handicapped People:1)
Collection (Materials For Handicapped People:2)
Collection (particular)
国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌
Access Restrictions
国立国会図書館内限定公開
Service for the Digitized Contents Transmission Service
図書館・個人送信対象外
Availability of remote photoduplication service
Holding library
国立国会図書館
Call No.
Z17-213
Periodical Title (Persistent ID (NDL))
info:ndljp/pid/2287041
Data Provider (Database)
国立国会図書館 : 国立国会図書館雑誌記事索引
Bibliographic ID (NDL)
8235965
Bibliographic Record Category (NDL)
632

Digital

Summary, etc.
Measurements were made of emission of secondary electrons and self-reflection of ions from the targets bombarded with 10-25kV accelerated ion beams available in a mass separator. Maximum energies of the secondary electrons were measured in the ion bombardments of Sb<SUP>+</SUP> on Sb, Sb<SUP>+</SUP>on Al, Mg<SUP>+</SUP>on Mg, and Mg<SUP>+</SUP>on Al surfaces. Secondary electron emission coefficients byion bombardment γi and ion self-reflection coefficients(SEEC and ISRC, respectively in the present work)were also obtained with Sb<SUP>+</SUP> and Mg<SUP>+</SUP> beams on various surfaces. These basic data led us to the discussion of the mechanism of secondary electron emission from the surface by ion bombardment in the energy range much higher than H. D. Hagstrum had examined, and further to the discussion of the effects of heavy ions translating and stopping in solid, irrespective of their origins.
DOI
10.5702/massspec1953.18.1169
Access Restrictions
インターネット公開
Data Provider (Database)
科学技術振興機構 : J-STAGE

Digital

Summary, etc.
Measurements were made of emission of secondary electrons and self-reflection of ions from the targets bombarded with 10-25kV accelerated ion beams available in a mass separator. Maximum energies of the secondary electrons were measured in the ion bombardments of Sb<SUP>+</SUP> on Sb, Sb<SUP>+</SUP>on Al, Mg<SUP>+</SUP>on Mg, and Mg<SUP>+</SUP>on Al surfaces. Secondary electron emission coefficients byion bombardment γi and ion self-reflection coefficients(SEEC and ISRC, respectively in the present work)were also obtained with Sb<SUP>+</SUP> and Mg<SUP>+</SUP> beams on various surfaces. These basic data led us to the discussion of the mechanism of secondary electron emission from the surface by ion bombardment in the energy range much higher than H. D. Hagstrum had examined, and further to the discussion of the effects of heavy ions translating and stopping in solid, irrespective of their origins.
Data Provider (Database)
国立情報学研究所 : CiNii Research
Original Data Provider (Database)
Japan Link Center
雑誌記事索引データベース
Crossref
CiNii Articles
Bibliographic ID (NDL)
8235965
NAID
130002033248