同位体分離器による基礎的データ-1-固体表面のイオン衝撃による二次電子放出率とイオン自己反射率の測定 固体内反跳イオン研究のモデル的方法
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- Material Type
- 記事
- Author/Editor
- 荒谷 美智
- Author Heading
- Periodical title
- 質量分析
- No. or year of volume/issue
- 18(3) 1970.09
- Volume
- 18
- Issue
- 3
- Pages
- 1169~1176
- Publication date of volume/issue (W3CDTF)
- 1970-09
- ISSN (Periodical Title)
- 0542-8645
- ISSN-L (Periodical Title)
- 0542-8645
- Publication (Periodical Title)
- 東京 : 日本質量分析学会
- Place of Publication (Country Code)
- JP
- Text Language Code
- jpn
- NDLC
- Target Audience
- 一般
- Collection
- Collection (Materials For Handicapped People:1)
- Collection (Materials For Handicapped People:2)
- Collection (particular)
- 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌
- Access Restrictions
- 国立国会図書館内限定公開
- Service for the Digitized Contents Transmission Service
- 図書館・個人送信対象外
- Availability of remote photoduplication service
- 可
- Holding library
- 国立国会図書館
- Call No.
- Z17-213
- Periodical Title (Persistent ID (NDL))
- info:ndljp/pid/2287041
- Data Provider (Database)
- 国立国会図書館 : 国立国会図書館雑誌記事索引
- Bibliographic ID (NDL)
- 8235965
- Bibliographic Record Category (NDL)
- 632
- Summary, etc.
- Measurements were made of emission of secondary electrons and self-reflection of ions from the targets bombarded with 10-25kV accelerated ion beams available in a mass separator. Maximum energies of the secondary electrons were measured in the ion bombardments of Sb<SUP>+</SUP> on Sb, Sb<SUP>+</SUP>on Al, Mg<SUP>+</SUP>on Mg, and Mg<SUP>+</SUP>on Al surfaces. Secondary electron emission coefficients byion bombardment γi and ion self-reflection coefficients(SEEC and ISRC, respectively in the present work)were also obtained with Sb<SUP>+</SUP> and Mg<SUP>+</SUP> beams on various surfaces. These basic data led us to the discussion of the mechanism of secondary electron emission from the surface by ion bombardment in the energy range much higher than H. D. Hagstrum had examined, and further to the discussion of the effects of heavy ions translating and stopping in solid, irrespective of their origins.
- DOI
- 10.5702/massspec1953.18.1169
- Access Restrictions
- インターネット公開
- Data Provider (Database)
- 科学技術振興機構 : J-STAGE
- Summary, etc.
- Measurements were made of emission of secondary electrons and self-reflection of ions from the targets bombarded with 10-25kV accelerated ion beams available in a mass separator. Maximum energies of the secondary electrons were measured in the ion bombardments of Sb<SUP>+</SUP> on Sb, Sb<SUP>+</SUP>on Al, Mg<SUP>+</SUP>on Mg, and Mg<SUP>+</SUP>on Al surfaces. Secondary electron emission coefficients byion bombardment γi and ion self-reflection coefficients(SEEC and ISRC, respectively in the present work)were also obtained with Sb<SUP>+</SUP> and Mg<SUP>+</SUP> beams on various surfaces. These basic data led us to the discussion of the mechanism of secondary electron emission from the surface by ion bombardment in the energy range much higher than H. D. Hagstrum had examined, and further to the discussion of the effects of heavy ions translating and stopping in solid, irrespective of their origins.
- DOI
- 10.5702/massspec1953.18.1169
- Related Material (URI)
- Data Provider (Database)
- 国立情報学研究所 : CiNii Research
- Original Data Provider (Database)
- Japan Link Center雑誌記事索引データベースCrossrefCiNii Articles
- Bibliographic ID (NDL)
- 8235965
- NAID
- 130002033248