Reliable Logic Circuits with Byte Error Control Codes -- a Feasibility Study

Publisher: Proceedings of 1996 International Symposium on Defect and Fault Tolerance in VLSI Systems

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Material Type: 図書
Title: Reliable Logic Circuits with Byte Error Control Codes -- a Feasibility Study
Author/Editor: 北神, 正人
Kitakami, Masato
Author Heading: 北神, 正人
Kitakami, Masato
Publication, Distribution, etc.: Proceedings of 1996 International Symposium on Defect and Fault Tolerance in VLSI Systems
Publication Date: 1996
Publication Date (W3CDTF): 1996
Periodical title: Proceedings of 1996 International Symposium on Defect and Fault Tolerance in VLSI Systems
Pages: 286-294
Text Language Code: eng
Target Audience: 一般
Note (General): identifier:oai:t2r2.star.titech.ac.jp:00024377
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 東京工業大学 : 東京工業大学リサーチリポジトリ