文書・図像類

Thresholds of Etchable Track Formation and Chemical Damage Parameters in PI, PET, PC, and PADC Films at the Stopping Powers Ranging from 10 to 12,000 keV/um

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Thresholds of Etchable Track Formation and Chemical Damage Parameters in PI, PET, PC, and PADC Films at the Stopping Powers Ranging from 10 to 12,000 keV/um

Material type
文書・図像類
Author
Yamauchi, Tomoyaほか
Publisher
-
Publication date
2012-10-27
Material Format
Paper
Capacity, size, etc.
-
NDC
-
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Note (General):

8th International Symposium on Swift Heavy Ions in Mater

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Paper

Material Type
文書・図像類
Author/Editor
Yamauchi, Tomoya
Mori, Yutaka
Kanasaki, Masato
Hattori, Atsuto
Matai, Yuri
Matsukawa, Kenya
Oda, Keiji
Kodaira, Satoshi
Kitamura, Hisashi
Konishi, Teruaki
Yasuda, Nakahiro
Tojo, Sachiko
Honda, Yoshihide
Barillon, Remi
服部 篤人
又井 悠里
松川 兼也
小平 聡
北村 尚
小西 輝昭
バリロン レミ
Publication Date
2012-10-27
Publication Date (W3CDTF)
2012-10-27
Text Language Code
eng
Target Audience
一般
Note (General)
8th International Symposium on Swift Heavy Ions in Mater
Data Provider (Database)
国立情報学研究所 : 学術機関リポジトリデータベース(IRDB)(機関リポジトリ)