Characteristic Charge Collection Mechanism Observed in FinFET SRAM cells

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Summary, etc.：: Characteristics of single event effects on 14/16-nm bulk FinFETs and static random access memories (SRAM) composed of them were investigated in terms ...

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Material Type: 文書・図像類
Title: Characteristic Charge Collection Mechanism Observed in FinFET SRAM cells
Author/Editor: Takeuchi, Kozo
Sakamoto, Keita
Yukumatsu, Kazuki
Watanabe, Kyota
Tsuchiya, Yuta
Kato, Takashi
Matsuyama, Hideya
Akinori, Takeyama
Takeshi, Ohshima
Kuboyama, Satoshi
Shindo, Hiroyuki
Author Heading: Takeuchi, Kozo
Sakamoto, Keita
Yukumatsu, Kazuki
Watanabe, Kyota
Tsuchiya, Yuta
Kato, Takashi
Matsuyama, Hideya
Akinori, Takeyama
Takeshi, Ohshima
Kuboyama, Satoshi
Shindo, Hiroyuki
Akinori, Takeyama
Takeshi, Ohshima
Publication Date: 2020-10-19
Publication Date (W3CDTF): 2020-10-19
Text Language Code: eng
Target Audience: 一般
Note (General): Radiation Effects on Components and Systems (RADECS2020)
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 国立研究開発法人量子科学技術研究開発機構 : 量子科学技術研究開発機構学術機関リポジトリ