Reducibility of sequential test generation to combinational test generation for several delay fault models

• Material Type: 文書・図像類
• Title: Reducibility of sequential test generation to combinational test generation for several delay fault models
• Author/Editor: Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo
• Author Heading: Iwagaki, Tsuyoshi; Ohtake, Satoshi; Fujiwara, Hideo
• Publication, Distribution, etc.: Nara Institute of Science and Technology
• Publication Date: 2003-09
• Publication Date (W3CDTF): 2003-09
• Periodical title: Information Science Technical Report
• No. or year of volume/issue: TR2003009
• Issue: TR2003009
• ISSN (Periodical Title): ISSN : 0919-9527
• Text Language Code: eng
• Target Audience: 一般
• Format (IMT): application/pdf
• Source: fulltext （fulltext）; https://naist.repo.nii.ac.jp/record/8824/files/R002725.pdf
• Access Restrictions: インターネット公開
• Periodical Title: URI; http://isw3.naist.jp/IS/TechReport/
• Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）; https://irdb.nii.ac.jp
• Original Data Provider (Database): 奈良先端科学技術大学院大学 : 奈良先端科学技術大学院大学学術リポジトリnaistar

• Summary, etc.: This paper presents a new structure, called discontinuous reconvergence structure (DR-structure), of sequential circuits with easy testability for del...