Lifetime Estimation of Defective Products from the Imaginal Mixture of Defective and Non-defective Products: The Trunsored Data Model

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Material Type: 文書・図像類
Title: Lifetime Estimation of Defective Products from the Imaginal Mixture of Defective and Non-defective Products: The Trunsored Data Model
Author/Editor: 廣瀬, 英雄
Author Heading: 廣瀬, 英雄ヒロセ, ヒデオ
Publication, Distribution, etc.: 九州工業大学
Publication Date: 2000-08-02
Publication Date (W3CDTF): 2000-08-02
Periodical title: Technical Report in Computer Science and Systems Engineering
Pages: 1-8
ISSN (Periodical Title): PISSN : 1344-8803
Text Language Code: eng
Subject Heading: Truncated data
Censored data
Trunsored data
Imaginal mixture model
Durable population
Fragile population
Weibull distribution
Likelihood ratio test
Target Audience: 一般
Format (IMT): application/pdf
Source: csse-10.pdf
https://kyutech.repo.nii.ac.jp/record/4111/files/csse-10.pdf
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 九州工業大学 : キューテイカー