ゲート酸化膜欠陥に起因する集積回路の信頼性と実測評価
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- Material Type
- 博士論文
- Author/Editor
- 岸田, 亮
- Author Heading
- Publication Date
- 2018-03-26
- Publication Date (W3CDTF)
- 2018-03-26
- Alternative Title
- Measurements and Evaluations of Reliability Issues Caused by Gate Oxide Defects in Semiconductor Chips
- Degree grantor/type
- 京都工芸繊維大学
- Date Granted
- 2018-03-26
- Dissertation Number
- 甲第872号