極微小電流計測型ナノプローブその場観察システムの開発

Material type: 文書・図像類

Author: 岩田, 博之ほか

Publisher: 愛知工業大学

Publication date: 2007-08-31

Material Format: Digital

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Note (General)：: Piezo-driving spedcimen holder for Atomic scale high-resolution electron-microscopy (TEM) was realized. Various in-situ experiments in TEM, example fo...

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Material Type: 文書・図像類
Title: 極微小電流計測型ナノプローブその場観察システムの開発
Author/Editor: 岩田, 博之
奥田, 東
Author Heading: 岩田, 博之
奥田, 東
Publication, Distribution, etc.: 愛知工業大学
Publication Date: 2007-08-31
Publication Date (W3CDTF): 2007-08-31
Alternative Title: New In-situ Electrical-Force Characterizing System for TEM
Periodical title: 総合技術研究所研究報告=Bulletin of Research Institute for Industrial Technology.
No. or year of volume/issue: 9
Volume: 9
Pages: 47-52
ISSN (Periodical Title): ISSN : 1344-9672
Text Language Code: jpn
Target Audience: 一般
Note (General): Piezo-driving spedcimen holder for Atomic scale high-resolution electron-microscopy (TEM) was realized. Various in-situ experiments in TEM, example for, strucyual variation, contact-force, contact electricalcurrent, bondig, separation were observed. The deformation process of multiwalled carbon nanotubes was directry observed using TEM. High elasticity and the subsequent damage process of the nanotube were demonstrated. In-situ Current-Voltage Characters were caliculated with several multimeters integrated with PC.
identifier:http://repository.aitech.ac.jp/dspace/handle/11133/1673
Access Restrictions: 限定公開
Periodical Title (NCID): AA11484797
https://ci.nii.ac.jp/ncid/AA11484797
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 愛知工業大学 : 愛知工業大学学術情報リポジトリ